The optoelectronic performance of the considered tandem solar cell has studied by using Solar Cell Capacitance Simulator (SCAPS-1D, version 3.3.07) software under AM1.5 illumination. SCAPS is a one-dimensional simulation tool with seven input semiconductor layers developed at the Department of Electronics and Information Systems, University of Gent, Belgium [23]. Furthermore, this software can measure precisely the open-circuit voltage, short-current density, quantum efficiency, fill factor, the band structure of heterojunctions, power conversion efficiency, spectral performance, electric field distribution, temperature, capacitance-voltage, generation and recombination profile, light bias, lighting from either the n-side or p-side, and frequency spectroscopy [24] as compared to other simulation software such as; Aestimo [25], PC1D [26], GPVDM [27] AFORS-HET [28].
The material considered for the comprehensive study of a single-junction and tandem configuration is CZTS and Si with a bandgap of 1.55 eV and 1.1 eV respectively. The upper subcell structure consists of an efficient layer such as ZnO:Al, i-ZnO, ZnMgO, and CZTS as shown in Fig. 1(a). A p-type CZTS semiconductor is used as an absorber layer for producing a carrier with the least absorbed light reflection and the lowest transmission losses [29]. The ZnO serves as a window layer because of its high n-type conductivity and wide bandgap [30] and n-type ZnMgO is used as a buffer layer. Thus, a buffer layer creates a junction along with the absorber layer to reduce absorption losses and direct the produced carrier to the electrodes. Whereas, the buffer layer will minimize surface losses along with the window layer [31]. Moreover, ZnMgO has a wide bandgap and as a buffer layer leads to reduce the recombination [32]. Also, ZnMgO as buffer layer has a perfect lattice match with the i-ZnO and ZnO:Al window layer [33, 34]. Similarly, the bottom subcell consisted of front contact, n-Si, p-Si, p++-Si/back contact as shown in Fig. 1(b). TiN is use as front contact of lower subcell with work function of 4.3eV because of its excellent chemical and thermal stability and quasi-metallic conductivity and as a copper diffusion barrier for interconnect technologies[35, 36]. A highly doped Back Surface Field (BSF) p++-Si used to minimize carrier recombination losses on the rear surface.
In the first step, the simulations of single-junction CZTS and Si solar cells were performed under the standard AM1.5 spectrum, and results are validated against the simulated data reported by[12, 37]. Further, the tandem design CZTS/ Si has presented in Fig. 1(c). The CZTS/Si tandem device has an ideal tunnel junction to have the same current density value in both subcells. However, because of the limitations of the SCAPS-1D simulator, between the upper and lower subcells, the ideal tunnel junction without optoelectric losses has presumed. It is essential to achieve a current matching condition between the cells to conduct the tandem design study. Thus, both cells has independently simulated with different illumination range. The upper subcell's current density and the transmitted spectra for the lower subcell have calculated by adjusting the upper subcell absorber layer thicknesses range from 0.1µm to 1µm. The transmitted spectrum was then used as the lower Si subcell of the input illumination spectrum. Next, determined the lower subcell Jsc values, and then each of the current matching points was calculated. A similar method is commonly used for reporting tandem design simulation using the SCAPS-1D [12, 19]. The material properties in Table 1 are taken from the literature and are used to simulate the photovoltaic response of the considered single and tandem solar cell [33, 38–45], whereas the optical absorption coefficients of CZTS are taken from file [46] and other are from SCAPS-1D, are presented in Fig. 2. Table 2 shows the basic equations for the SCAPS-1D and transmitted spectrum [47, 48].
Table 1
Material parameters used in single Junction tandem solar cell simulation
Material Properties | Window Layer ZnO | i:ZnO | ZnMgO | CZTS | Si (n) | Si (p+) | Si( P++) |
Thickness d (µm) | 0.01 | 0.02 | 0.02 | variable | 0.02 | 80 | 0.1 |
Bandgap (eV) | 3.37 | 3.3 | 3.32 | 1.55 | 1.1 | 1.1 | 1.1 |
Electron affinity ᵡ(eV) | 4.45 | 4.6 | 4.53 | 4.5 | 4.05 | 4.05 | 4.05 |
Relative permittivity (𝜺) | 9 | 9 | 9 | 10 | 11.9 | 11.9 | 11.9 |
Conduction band effective density of states (cm− 3) | 2.2×1018 | 2.2×1018 | 2.2×1018 | 2.2×1018 | 2.8×1019 | 2.8×1019 | 2.8×1019 |
Valence band effective density of states (cm− 3) | 1.8×1019 | 1.8×1019 | 1.8×1019 | 1.8×1019 | 2.6×1019 | 2.6×1019 | 2.6×1019 |
Electron mobility µn (cm2/Vs) | 1.00×102 | 1.00×102 | 1.00×102 | 1.00×102 | 1.041×103 | 1.041×103 | 1.041×103 |
Hole mobility µP (cm2/Vs) | 2.5×101 | 2.5×101 | 2.5×101 | 3.5×101 | 4.21×102 | 4.21×102 | 4.21×102 |
Donor density ND (cm− 3) | 1.0×1020 | 1.0×1018 | 1.0×1020 | 1.0×101 | 8.0×1020 | 1.0×101 | 1.0×101 |
Acceptor density NA (cm− 3) | 0.0×100 | 0.0×100 | 1.0×100 | 1.0×1017 | 1.0×101 | 5.0×1018 | 1.0×1022 |